AFM-Raman
Coupling these 2 technologies from HORIBA means having the full power of Raman, Photoluminescence, AFM, Tip-Enhanced Raman Spectroscopy (TERS), Tip-Enhanced Photoluminescence (TEPL), and many other AFM modes correlated with spectroscopic measurements, all together on the same AFM-Raman integrated platform. This provides a unique technique for the characterization of molecules, 1D and 2D materials, semiconducting nanostructures and bio-materials.
All AFM-Raman spectroscopy systems are capable of analysing its samples just within minutes (not hours!)
All AFM-Raman spectroscopy systems are capable of analysing its samples just within minutes (not hours!)
AFM - Raman System with Tip Enhanced Raman Spectroscopy (TERS)
xplora nanoXploRA Nano is a fully integrated compact AFM-Raman System. It combines high performance with ease-of-use, speed & reliability.
Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system. |
SPECIFICATIONS
Sample scanning range 100 µm x 100 µm x 15 µm (±10 %) Scanning type by sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Sample size Maximum 40 x 50 mm, 15 mm thickness |
labram hr nanoFully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer.
LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance. |
SPECIFICATIONS
Sample Scanning Range 100 µm x 100 µm x 15 µm (±10 %) Scanning Type by Sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Sample Size Maximum 40 x 50 mm, 15 mm thickness |
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Related Instruments
*Pictures shown above are for reference only. Actual product may differ slightly.
*Some products may not be available in all countries. Please contact us for further information and clarification. |
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