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PHOTON INC. is a leading supplier of Laser Beam Profilers and electro-optical instrument systems for fast and accurate measurement, testing and analysis of laser and light sources, optical components for telecommunications, and other applications.
Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. The technique involves a microscope objective lens to image the beam onto a detector. Photon Inc. has several near-field profiling instrument to fit a variety of applications.
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Measuring the near field of sources such as laser diodes, VCSELs, optical fiber, and/or waveguides can be a difficult task. Accurate measurement of such small sources to the micron level requires high precision in the optical and mechanical design. To simplify this task and to fill this requirement, Photon offers several models of Near-Field Profilers (NFPs) covering a wide range of wavelengths and power levels. Another important application of these instruments is to extend the focused laser spot size measurement range of the NanoScan profiler. The NanoScan NFPs are easy-to-use turnkey systems that can be used either as a stand-alone instrument or integrated into manufacturing inspection systems.
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Near field profiling is performed in fiber and waveguide analysis, lens characterization, and other applications where beams 50 microns or smaller are analyzed. While there are more accurate techniques to measure these beam sizes, the camera provides two-dimensional information that cannot always be obtained through knife-edge or scanning slit methods.
Photon offers a line of camera based near-field profilers based on the 2/3-inch USBeamPro CMOS camera and the 1/2-inch and 2/3-inch FireWire CCD cameras. The systems include the camera, ATP-SM continuously variable attenuator, bracket and 60X magnification microscope objective lens, with broadband AR coating.
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