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dBm Optics provides a line of photonic measurement and control
instruments to support the goals of high-yield, high-throughput
production manufacturing. We also have a range of instruments designed
specifically for applications in research and development. Whether you
measure component response on a production floor or work in R&D, dBm Optics provides solutions that will meet your technical needs at budget-friendly prices. Value means three things at dBm Optics; technical excellence, superior reliability and world-class support.
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The 4600 PDL Meter will characterize loss, polarization dependency and
return loss quickly, accurately and repeatable—all at an affordable
cost.
dBm technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized at between one and 9 wavelengths over multiple bands in <1 second. An 8 channel device can also be fully characterized in <1 second. The PDL measurement of the 4600 performs fast and accurate measurement
of the polarization dependency of the device, using either all-state or
matrix method. Both methods are highly accurate, due to real-time
referencing within the meter, eliminating the effects of source noise
and repeatability. It also eliminates the need to do reference
measurements. Further increasing throughput and reducing production
uncertainty.
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The 4650 Swept Spectrometer™ will characterize loss, polarization
dependency and return loss quickly, accurately and repeatable—all at an
affordable cost. dBm technology supports unprecedented optical repeatability, accuracy,
and speed. A device can be characterized over a 100 nm span at 1 pm
resolution with 1 pm and 0.015 dB accuracy in less than 1 second. The PDL meter function of the 4650 performs fast and accurate
measurement of the polarization dependency of the device, using either
all-state or matrix method. The matrix method will characterizing
100,000 points of PDL in ~1 second.
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Fast, Accurate Passive Component Test System
The 2004 Component Spectrum Analyzer™ will characterize loss,
polarization dependency and return loss quickly, accurately and
repeatable—all at an affordable cost. dBm technology supports
unprecedented optical repeatability, accuracy, and speed. A device can
be characterized over a 100 nm span at 1 pm resolution with 1 pm and
0.015 dB accuracy in less than 1 second. The PDL meter function of the 2004 performs fast and accurate
measurement of the polarization dependency of the device, using either
all-state or matrix method. The matrix method will characterizing
100,000 points of PDL in ~1 second.
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The 4700 Photodiode Characterizer is a complete photodiode test system.
It will characterize PDs or APDs (upcoming) without the need for
additional power supplies. It is this simple: connect your device and
press start. Like the dBm Optics optical power meters, the dBm Optics photodiode
meters employ an electrometer-based design. This approach allows much
lower currents to be measured (below 200 fA) at much higher speeds.
Normal current meter approaches cannot operate this fast because the
impedance and input capacitance combines with that of the photodiode to
yield slow response time. This is not the case with the dBm Optics 4700.
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